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Browsing by Subject "Built-in Self-Test (BIST)"

Browsing by Subject "Built-in Self-Test (BIST)"

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  • Rahman, Tasnim Ikra (Daffodil International University, 2019-07-01)
    Fault identification of analog and mixed signal circuits is very difficult topics for previous few decades. Localization of hard and soft faults in analog circuit is often a troublesome task without a transparent cut ...

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