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Browsing Volume 2, Issue 2, July 2007 by Subject "HEMT, Trap charge, impact ionization"

Browsing Volume 2, Issue 2, July 2007 by Subject "HEMT, Trap charge, impact ionization"

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  • Zaman, Saif; Parker, Anthony (Daffodil International University, 2007-07-01)
    Impact ionization effects on hole trapping phenomena In high electron mobility transistor (HEMT) is investigated. For the purpose, measurement and a trap model simulation was done for two test devices. Measured and ...

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