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DIU Journal of Science and Technology
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Vol. 14, Issue 1, July 2019
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Now showing items 1-6 of 1
Built-in Self-Test (BIST) (1)
Detectability (1)
Integrated Circuits testing (1)
Simulation after Test (SAT) (1)
Simulation before Test (SBT) (1)
Tolerance (1)
Now showing items 1-6 of 1
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