Abstract:
Fault identification of analog and mixed
signal circuits is very difficult topics for previous few
decades. Localization of hard and soft faults in analog
circuit is often a troublesome task without a transparent
cut methodology. For manufacturing process of Very
Large Scale Integration (VLSI) Application Specific
Integrated Circuits (ASICs) both fault diagnosis and
localization are mandatory. The importance of such
analog test has become important due to enhancement
of networking and communication sector. This paper
gives a brief review on the faults present in analog
circuits and different diagnosis methodologies of these
faults. Comparison of detection is also demonstrated
among some techniques for some of the ITC97
Benchmark circuits.
