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Test case generation for event driven systems using 4-way input test strategy

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dc.contributor.author Rahman, Mostafijur
dc.contributor.author Othman, Rozmie Razif
dc.contributor.author Ahmad, R Badlishah
dc.contributor.author Rahman, Md. Mijanur
dc.date.accessioned 2018-09-24T07:12:43Z
dc.date.accessioned 2019-05-27T09:59:34Z
dc.date.available 2018-09-24T07:12:43Z
dc.date.available 2019-05-27T09:59:34Z
dc.date.issued 2016-04-11
dc.identifier.uri http://hdl.handle.net/20.500.11948/3302
dc.description.abstract Since 1990's Combinatorial explosion is a crucial topic in software testing domain. In this domain the exhaustive input interaction test is not practical solution to test all software configurations for generating test cases. T-way test strategy provides a solution to overcome the problem. To date, most of the research on designing methods focus on combinations of input parameter values, where the T-way test strategy is applied to generate final test cases. However the methods are not applicable for event driven systems, where inputs are tested in the ordered form. In this paper a new method is proposed on T-way strategy to generate test cases using 4-way input interaction technique. The generated test cases are compared with the existing 4-way strategies. Result shows that in most cases the proposed method is able to generate efficient test cases compared with existing 4-way methods. Full Text Link: http://doi.org/10.1109/SCORED.2015.7449422 en_US
dc.language.iso en en_US
dc.publisher IEEE Xplore en_US
dc.subject Algorithm design and analysis en_US
dc.subject Testing en_US
dc.subject Software en_US
dc.subject Heuristic algorithms en_US
dc.subject Conferences en_US
dc.subject Research and development en_US
dc.subject Computers en_US
dc.title Test case generation for event driven systems using 4-way input test strategy en_US
dc.type Article en_US


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